Počet citací článků publikovaných v časopisech: 876
Počet citací článků publikovaných ve sbornících: 74
Počet citací, které neuvádějí přesný zdroj mých prací: 22
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Tyagi, M; Rothfuss, HE; Donnald, SB; Koschan, M; Melcher, CL: Effect of Ca2+ Co-Doping on the Scintillation Kinetics of Ce Doped Gd3Ga3Al2O12. IEEE Trans. Nucl. Sci., Part. 61/2 1 (2014), p.297-300.
Bok, J: Cathodoluminescence mechanism of YAG:Ce single crystals (Mechanismus katodoluminisce monokrystalu YAG:Ce). PhD Thesis, Masaryk University Brno, Czech Republic (2014).
Schauer, P; Bok, J: Innovation possibilities of scintillation electron detector for SEM. IMC 2014 - The International Microscopy Congress 2014, Prague, Czech Republic IT-4 O-1674 (2014).
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Tyagi, M; Singh, SG; Singh, AK; Desai, DG; Tiwari, B; Sen, S; Datta, R; Gadkari, SC; Gupta, SK: Development of Gd3Ga3Al2O12:Ce single crystal scintillator and USB based portable gamma-ray spectrometer. Barc Newsletter, ISSN 0976-2108, (no.343) 343 (2015), p.33-38.
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Bartosiewicz, K; Babin, V; Kamada, K; Yoshikawa, A; Nikl, M: Energy migration processes in undoped and Ce-doped multicomponent garnet single crystal scintillators. J. Lumines. 166 (2015), p.117-122.
Prusa, P; Kucera, M; Mares, JA; Onderisinova, Z; Hanus, M; Babin, V; Beitlerova, A; Nikl, M: Composition Tailoring in Ce-Doped Multicomponent Garnet Epitaxial Film Scintillators. Cryst. Growth Des. 15 8 (2015), p.3715-3723.
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Nikl, M; Yoshikawa, A: Recent R&D Trends in Inorganic Single-Crystal Scintillator Materials for Radiation Detection. Adv. Opt. Mater., Spec. 3 4/SI (2015), p.463-481.
Tyagi, M; Meng, F; Koschan, M; Singh, AK; Melcher, CL; Gadkari, SC: Effect of Co-doping On the Radiation Hardness of Gd3Ga3Al2O12: Ce Scintillators. IEEE Trans. Nucl. Sci., Part. 62/2 1 (2015), p.336-339.
Chewpraditkul, W; Pattanaboonmee, N; Chewpraditkul, W; Kamada, K; Yoshikawa, A; Nikl, M: Luminescence and Light Yield in Ce3+-Doped Y1Gd2Al5-xGaxO12 (x= 2, 3, 4) Single Crystal Scintillators. Applied Mechanics and Materials 709 (2015), p.390-393.
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Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: Scintilacni detektor v rastrovacim elektronovem mikroskopu. Sbornik sympozia o stavu a perspektivach scintilacnich detektoru a jejich vyuziti, Harrachov, (1980), p.80. Práce, které uvádějí citaci:
Meil'Man, ML; Kolomiitsev, AI; Baskakova, ZM; Bagdasarov, KS; Kevorkov, AM: Determination of the content of rare-earth elements in yttrium-aluminum garnet crystals by the method of absorption spectrophotometry. Journal of Applied Spectroscopy 43 5 (1985), p.1250-1254.
Autrata R., Schauer P., Kvapil Jos., Kvapil Ji.: A single crystal of Y3Al5O12:Ce3+ as a scintillator in SEM and transparent screen in electron optical devices. 10th. International Congress on Electron Microscopy, Vol. I, Hamburg, (1982), p.451. Práce, které uvádějí citaci:
Seiler, H: Secondary Electron Emission in the Scanning Electron Microscope. J. Appl. Phys. 54 (1983), p.R1.
Reimer, L: Interaction of Electrons with Bulk Specimens. Quantitative Electron Microscopy 25 (1984), p.217.
Autrata R., Schauer P., Kvapil Ji., Kvapil Jo.: Influence of Ce3+ and other dopants concentration in single crystals of Y3Al5O12 and YAlO3 on their cathodoluminescent properties. European meeting on crystal growth, Prague, (1982), p.435. Práce, které uvádějí citaci:
Autrata, R; Schauer, P; Kvapil, J; Kvapil, J: A single-crystal of YAlO3-Ce3+ as a fast scintillator in sem. Scanning 5 2 (1983), p.91-96.
Autrata R., Schauer P., Kvapil Ji., Kvapil Jos.: Single-crystal electron detectors. 8th. European Congress on Electron Microscopy, Vol. I, Budapest, (1984), p.617. Práce, které uvádějí citaci:
Berger, SD; McMullan, D: Parallel Recording for an Electron Spectrometer on a Scanning Transmission Electron Microscope. Ultramicroscopy 28 (1989), p.122.
Autrata, R: Backscattered Electron Imaging Using Single Crystal Scintillator Detectors. Scanning Microsc. 3 3 (1989), p.739.
Schauer P., Autrata R.: Influence of single crystal yttrium aluminates surfaces on their cathodoluminescent properties. 7th. Czechoslovak conference on electronics and vacuum physics, Vol. 1, Bratislava, (1985), p.265. Práce, které uvádějí citaci:
Autrata, R: Backscattered Electron Imaging Using Single Crystal Scintillator Detectors. Scanning Microsc. 3 3 (1989), p.739.
Hibino M., Irie K., Autrata R., Schauer P.: YAG single crystals for scintillators of STEM. XIIth International Congress for Electron Microscopy, San Francisco, (1990), p.166. Práce, které uvádějí citaci:
Kirkland, EJ; Thomas, MG: A high efficiency annular dark field detector for STEM. Ultramicroscopy 62 1-2 (1996), p.79-88.
Schauer P., Autrata R.: Coatings of Single Crystal Scintillators for Electron Detectors in SEM. 10th European Congress on Electron Microscopy, Vol. I, Granada, Spain, (Sept 1992), p.107. Práce, které uvádějí citaci:
Autrata, R; Schauer, P: Cathodoluminescent properties of single crystal materials for electron microscopy. Scanning Microscopy (Supplement) 9 (1995), p.1-12.
Novak, L; Mullerova, I: Single electron response of the scintillator-light guide-photomultiplier detector. J. Microsc.-Oxf. 233 1 (2009), p.76-83.
Schauer, P: Optimization of decay kinetics of YAG:Ce single crystal scintillators for S(T)EM electron detectors. Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms 269 21 (2011), p.2572-2577.
Novak, L: Methods for quantification of detection channel for secondary electrons in scanning electron microscope. PhD Thesis, Masaryk University, Brno (2011).
Schauer, P; Bok, J: Study of spatial resolution of YAG:Ce cathodoluminescent imaging screens. Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms 308 (2013), p.68-73.
Autrata R., Schauer P.: Collection of Low-Energy Signal Electrons in the Rotationally Symmetric Electrostatic Field of a Detector. Three Countries' EM Conference, BEDO 1993, Zurich, Switzerland, (Sept 1993). Práce, které uvádějí citaci:
Reimer, L: Electron Detectors and Spectrometers. in: Scanning Electron Microscopy - Physics of Image Formation and Microanalysis, Springer-Verlag, Berlin Heidelberg, 1998 Chapter 5 (1998), p.171-205.
Schauer P., Autrata R.: Efficiency of SEM/STEM Scintillation Electron Detectors with Edge Guided Signal. Multinational Congress on Electron Microscopy, Parma, Italy, (Sept 1993), p.357-358. Práce, které uvádějí citaci:
Schauer, P; Autrata, R: Computer optimized design of BSE scintillation detector for SEM. EUREM-11, the Eleventh European Congress on Electron Microscopy (Edited and Published by the CESM, Brussels 1998), Dublin, Ireland (1996), p.369-370.
Frank, L; Mullerova, I: Diffraction contrast in cathode lens equipped Low-Energy SEM. Proc. 11th European Congress on Microscopy - EUREM 11, Dublin, Ireland, 1996 (1996).
Autrata, R; Schauer, P; Madea, D: Single crystal scintillators for BSE detectors in SEM. EUREM-11, the Eleventh European Congress on Electron Microscopy (Edited and Published by the CESM, Brussels 1998), Dublin, Ireland 1 467 (1996).
Schauer, P.; Autrata, R.: Time Response of Single Crystal Scintillation Detectors for SEM/STEM. 13th International Congress on Electron Microscopy (ICEM 13), Vol. I, Paris, France, (July 1994), p.227-228. Práce, které uvádějí citaci:
Zuo, JM: Electron detection characteristics of slow-scan CCD camera. Ultramicroscopy 66 1-2 (1996), p.21-33.
Reimer, L: Electron Detectors and Spectrometers. in: Scanning Electron Microscopy - Physics of Image Formation and Microanalysis, Springer-Verlag, Berlin Heidelberg, 1998 Chapter 5 (1998), p.171-205.
Autrata, R.; Schauer, P.: Behaviour of Planar and Annular YAG Single Crystal Detectors for LVSEM Operation. 13th International Congress on Electron Microscopy (ICEM 13), Vol. I, Paris, France, (July 1994), p.71-72. Práce, které uvádějí citaci:
Mullerova, I; Frank, L: Scanning low-energy electron microscopy. Advances In Imaging And Electron Physics, Vol 128; ADVANCES IN IMAGING AND ELECTRON PHYSICS 128 (2003), p.309-443.
Vedrenne, N; Hug, G; Fleury, B: Optimisation of a high resolution highly sensitive detector for fast electrons. Proc. 13th European Microscopy Congress - EMC 2004, Antwerp, Belgium (2004), p.IM02.P02.
Schauer, P.; Autrata, R.: Some Methods for Investigation of Detector Components for Electron Microscopy. 5th Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic, (June 1996), p.47-50. Práce, které uvádějí citaci:
Horak, P: Study of Degradability and Metastability in Organo-Silicon Materials (Studium degradability a metastability v organo-kremikovych materialech). PhD Thesis, Brno Technology University, Czech Republic (2007).
Hejna, J: Detektory elektronow w elektronowych mikroskopach skaningowych wysoko prozniowych. Prace Naukowe Instytutu Materia?éoznawstwa i Mechaniki Technicznej Politechniki Wroclawskiej. Monografie 66 27 (2010), p.3-215.
Novak, L: Methods for quantification of detection channel for secondary electrons in scanning electron microscope. PhD Thesis, Masaryk University, Brno (2011).
Schauer, P.; Autrata, R.: Computer Designed Scintillation Detectors for SEM. 5th Seminar of Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic, (June 1996), p.73-74. Práce, které uvádějí citaci:
Hejna, J: Detektory elektronow w elektronowych mikroskopach skaningowych wysoko prozniowych. Prace Naukowe Instytutu Materia?éoznawstwa i Mechaniki Technicznej Politechniki Wroclawskiej. Monografie 66 27 (2010), p.3-215.
Schauer, P.; Autrata, R.: Computer optimized design of BSE scintillation detector for SEM. EUREM-11, the Eleventh European Congress on Electron Microscopy (Edited and Published by the CESM, Brussels 1998), Vol. 1, Dublin, Ireland, (Aug 1996), p.369. Práce, které uvádějí citaci:
Frank, L; Mullerova, I: Strategies for low- and very-low-energy SEM. J Electron Microsc 48 3 (1999), p.205-219.
Mullerova, I; Frank, L: Scanning low-energy electron microscopy. Advances In Imaging And Electron Physics, Vol 128; ADVANCES IN IMAGING AND ELECTRON PHYSICS 128 (2003), p.309-443.
Schauer, P.; Autrata, R.: Cathodoluminescent Properties of Single Crystals for S(T)EM Detectors. 6th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno), (Jun 1998), p.60-63. Práce, které uvádějí citaci:
Hejna, J: Detektory elektronow w elektronowych mikroskopach skaningowych wysoko prozniowych. Prace Naukowe Instytutu Materia?éoznawstwa i Mechaniki Technicznej Politechniki Wroclawskiej. Monografie 66 27 (2010), p.3-215.
Schauer, P.; Autrata, R.: Performance of YAG:Ce Single Crystal Screens for TEM. 14th International Congress on Electron Microscopy (ICEM 14), Vol. 1, Cancun, Mexico, (Aug 1998), p.633-634. Práce, které uvádějí citaci:
Schauer, P; Autrata, R: Study of TEM fluorescent screens. 4th Multinational Congress on Electron Microscopy, Veszprem Hungary (1999), p.167-168.
Schauer, P; Autrata, R: Performance of detector elements for electron microscopes. 12th European Congress on Electron Microscopy, Brno, Czech Republic 3 I (2000), p.455-458.
Schauer, P; Vlcek, I; Autrata, R: Improved Recording System for the Study of Single Crystal Imaging Screens. 5th Multinational Congress on Electron Microscopy, Lecce, Italy Proc (2001), p.533-534.
Bauer, E: Instrumentation. in: Surface Microscopy with Low Energy Electrons, Springer, New York, NY, 2014 Chapter 3 (2014), p.89-188.
Schweizer, P: Manipulation of individual defects in 2D and layered materials. PhD Thesis, der Technischen Fakultät, der Friedrich-Alexander-Universität, Erlangen-Nürnberg (2019).
Autrata, R.; Schauer, P.: Single Crystal Scintillation Detectors for LVSEM. 14th International Congress on Electron Microscopy (ICEM 14), Vol. 1, Cancun, Mexico, (Aug 1998), p.437-438. Práce, které uvádějí citaci:
Autrata, R; Jirák, J: Scanning electron microscopy at low vacuum in specimen chamber. EUREM 12 - 12th European Congress on Electron Microscopy, Brno, Czech Republic I I 211 (2000).
Autrata, R; Schauer, P; Jirak, J: Detection of backscattered electrons for biological specimens study. 5th Multinational Congress on Electron Microscopy, Lecce, Italy (2001), p.519-520.
Mullerova, I; El-Gomati, MM; Frank, L: Imaging of the boron doping in silicon using low energy SEM. Ultramicroscopy 93 3-4 (2002), p.223-243.
Mullerova, I; Frank, L: Scanning low-energy electron microscopy. Advances In Imaging And Electron Physics, Vol 128; ADVANCES IN IMAGING AND ELECTRON PHYSICS 128 (2003), p.309-443.
Autrata, R; Schauer, P: Nanoresolution BSE images created using a new type of YAG II scintillator. EMC 2004 - 13th European Microscopy Congress, Antwerp, Belgium I 75-76 (2004).
Mullerova, I; Frank, L: Contrast at very low energies of the gold/carbon specimen for resolution testing. Scanning 26 1 (2004), p.18-24.
Schauer, P.; Autrata, R.: Performance of Detector Elements for Electron Microscopes. 12th European Congress on Electron Microscopy, Vol. 3, Brno, Czech Republic, (Jul 2000), p.I 455. Práce, které uvádějí citaci:
Hejna, J: Detektory elektronow w elektronowych mikroskopach skaningowych wysoko prozniowych. Prace Naukowe Instytutu Materia?éoznawstwa i Mechaniki Technicznej Politechniki Wroclawskiej. Monografie 66 27 (2010), p.3-215.
Schauer, P.; Vlcek, I.; Autrata, R.: Improved Recording System for the Study of Single Crystal Imaging Screens. 5th Multinational Congress on Electron Microscopy, Lecce, Italy, (Sep 2001), p.533-534. Práce, které uvádějí citaci:
Schauer, P; Autrata, R: Experimental and simulative methods for scintillation detector optimization. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalsky Dvur (Brno) (2004), p.67-68.
Autrata, R.; Schauer, P.; Jirak, J.: Detection of backscattered electrons for biological speciments study. 5th Multinational Congress on Electron Microscopy, Lecce, Italy, (Sep 2001), p.519-520. Práce, které uvádějí citaci:
Nedela, V; Hrib, J; Havel, L; Hudec, J; Runstuk, J: Imaging of Norway spruce early somatic embryos with the ESEM, Cryo-SEM and laser scanning microscope. Micron 84 (2016), p.67-71.
Schauer, P.; Autrata, R.: Experimental Setup for Cathodoluminescence Spectra Measurement. 15th International Congress on Electron Microscopy (ICEM 15), Vol. 3, Durban, South Africa, (Sep 2002), p.337-338. Práce, které uvádějí citaci:
Schauer, P; Autrata, R: Cathodoluminescence Spectra Measurement. 7th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalsky Dvur (Brno) Proc (2002), p.67-70.
Schauer, P; Nespurek, S; Schauer, F; Autrata, R: Cathodoluminescence study of silicon polymers. Fine Mechanics and Optics (Jemna mechanika a optika) 48 (2003), p.156-157.
Schauer, P; Nespurek, S; Schauer, F; Autrata, R: Electron beam degradation study of silicon polymers. 6th Multinational Congress on Microscopy, Pula, Croatia (2003), p.205-206.
Schauer, P; Autrata, R: Experimental and simulative methods for scintillation detector optimization. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalsky Dvur (Brno) (2004), p.67-68.
Bok, J: Cathodoluminescence kinetics of scintillators and resists for e-beam devices (Kinetika katodoluminiscence scintilatoru a rezistu pro pristroje s elektronovym svazkem). Master Thesis, Masaryk University Brno, Czech Republic (2010).
Autrata, R.; Schauer, P.: New Fast and Efficient YAP Scintillator for the Detection i SEM. 15th International Congress on Electron Microscopy (ICEM 15), Vol. 3, Durban, South Africa, (Sep 2002), p.347-348. Práce, které uvádějí citaci:
Novak, L; Mullerova, I: Single electron response of the scintillator-light guide-photomultiplier detector. J. Microsc.-Oxf. 233 1 (2009), p.76-83.
Novak, L: Methods for quantification of detection channel for secondary electrons in scanning electron microscope. PhD Thesis, Masaryk University, Brno (2011).
Schauer, P.; Autrata, R.: Cathodoluminescence Spectra Measurement. 8th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno), (Jul 2002), p.67-70. Práce, které uvádějí citaci:
Horak, P; Schauer, P: Cathodoluminescence of polysilanes. 9th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalsky Dvur (Brno) (2004), p.31-32.
Schauer, P.; Nespurek, S.; Schauer, F.; Autrata, R.: Optimization of Poly-(Methylphenylsilylene) Specimens for Cathodoluminescence Measurement. 31st Microscopy Conference - International Forum for Advanced Microscopy, Dresden, Germany, (Sept 2003), p.156-157. Práce, které uvádějí citaci:
Horak, P; Schauer, P: Degradation of Poly [methyl (phenyl) silylene] cathodoluminescence. 2nd European Weathering Symposium - Natural and Artificial Ageing of Polymers, Gothenburg, Sweden (2005), p.311-319.
Horak, P; Schauer, P: Cathodoluminescence as a method for the study of degradation of polysilanes. Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms 252 2 (2006), p.303-307.
Horak, P: Study of Degradability and Metastability in Organo-Silicon Materials (Studium degradability a metastability v organo-kremikovych materialech). PhD Thesis, Brno Technology University, Czech Republic (2007).
Schauer, P.; Autrata, R.: Optimization of scintillation detector for SEM. EMC 2004 - 13th European Microscopy Congress, Vol. I, Antwerp, Belgium, (Aug 2004), p.69-70. Práce, které uvádějí citaci:
Schauer, P: Decay Time Optimization of YAG:Ce Scintillator for S(T)EM Electron Detector. IMC 16 - 16th International Microscopy Congress, Sapporo, Japan 2 665 (2006).
Szilagyi, JM: Extreme ultraviolet spectral streak camera. Masteers Thesis, University of Central Florida (2010).
Schauer, P: Optimization of decay kinetics of YAG:Ce single crystal scintillators for S(T)EM electron detectors. Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms 269 21 (2011), p.2572-2577.
Autrata, R.; Schauer, P.: Nanoresolution BSE images created using a new type of YAG II scintillator. EMC 2004 - 13th European Microscopy Congress, Vol. I, Antwerp, Belgium, (Aug 2004), p.75-76. Práce, které uvádějí citaci:
Wandrol, P; Roubalikova, L; Autrata, R: Imaging of Tooth Surface Using the Different Detection Modes in SEM. Proc. 7th Multinational Congress on Microscopy, Portoroz, Slovenia (2005), p.489-490.
Wandrol, P; Autrata, R: Detection of Low Energy Backscattered Electrons in SEM. Proc. Dreilandertagung Microscopy Conference 2005, Davos, Switzerland (2005), p.61-62.
Wandrol, P; Matejkova, J; Autrata, R: SEM Observation of Multilayer Semiconductor Structures Using Different Detection Modes. Proc. Dreilandertagung Microscopy Conference 2005, Davos, Switzerland (2005), p.338-339.
Schauer, P.; Autrata, R.: Monte Carlo Simulation Code for Photon Collection in S(T)EM Scintillation Detectors. 7th Multinational Congress on Microscopy, Portoroz, Slovenia, (June 2005), p.199-200. Práce, které uvádějí citaci:
Horak, P: Study of Degradability and Metastability in Organo-Silicon Materials (Studium degradability a metastability v organo-kremikovych materialech). PhD Thesis, Brno Technology University, Czech Republic (2007).
Schauer, P.; Autrata, R.: Extended Algorithm for Optimization of Photon Transport in Scintillation Detector. Dreiländertagung Microscopy Conference 2005, Davos, Switzerland, (Aug 2005), p.55. Práce, které uvádějí citaci:
Schauer, P: Decay Time Optimization of YAG:Ce Scintillator for S(T)EM Electron Detector. IMC 16 - 16th International Microscopy Congress, Sapporo, Japan 2 665 (2006).
Horák, P.; Schauer, P.: Degradation of Poly[methyl(phenyl)silylene] cathodoluminescence. 2nd European Weathering Symposium - Natural and Artificial Ageing of Polymers, Gothenburg, Sweden, (June 2005), p.311-319. Práce, které uvádějí citaci:
Sula, P: Characterization of poly (phenylmethylsilylene) by selected thermal analysis methods (Charakterizácia poly(fenylmetylsilylénu) vybranymi metódami termickej analyzy). Master Thesis, Tomas Bata University, Zlin, Czech Republic (2012).
Horák, P.; Schauer, P.: Analysis of electron beam degraded poly[methyl(phenyl)silylene]. 8th Multinational Congress on Microscopy, Prague, Czech Rep., (June 2007), p.257-258. Práce, které uvádějí citaci:
Sula, P: Characterization of poly (phenylmethylsilylene) by selected thermal analysis methods (Charakterizácia poly(fenylmetylsilylénu) vybranymi metódami termickej analyzy). Master Thesis, Tomas Bata University, Zlin, Czech Republic (2012).
Bok, J.; Schauer, P.: Quality assessment of scintillation detector in SEM using MTF. 13th Inter. Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (Brno), (June 2012), p.9-10. Práce, které uvádějí citaci:
Bok, J; Schauer, P: Mechanism of electron-photon conversion in YAG:Ce scintillator for SEM electron detectors. MC 2013 - Microscopy Conference 2013, Regensburg, Germany 121-122 (2013).
Kucera, M.; Onderisinova, Z.; Hanus, M.; Prusa, P.; Bok, J.; Schauer, P.; Lalinsky, O.; Nikl, M.: Improved scintillation response of Ce doped GGAG garnet films: A pathway to high LY materials. SCINT 2015 - 13th International Conference on Inorganic Scintillators and Their Applications, Berkeley, USA, (June 2015), p.O14-1. Práce, které uvádějí citaci:
Onderisinova, Z; Kucera, M; Hanus, M; Lalinsky, O; Bok, J; Schauer, P; Nikl, M: Cathodoluminescence decay kinetics of Ce3+ doped LuAG:GdGa multicomponent garnets. SCINT 2015 - 13th International Conference on Inorganic Scintillators and Their Applications, Berkeley, USA Proc (2015), p.O5-6.
Onderisinova, Z.; Kucera, M.; Hanus, M.; Lalinsky, O.; Bok, J.; Schauer, P.; Nikl, M.: Cathodoluminescence decay kinetics of Ce3+ doped LuAG:GdGa multicomponent garnets. SCINT 2015 - 13th International Conference on Inorganic Scintillators and Their Applications, Berkeley, USA, (June 2015), p.O5-6. Práce, které uvádějí citaci:
Kucera, M; Onderisinova, Z; Hanus, M; Prusa, P; Bok, J; Schauer, P; Lalinsky, O; Nikl, M: Improved scintillation response of Ce doped GGAG garnet films: A pathway to high LY materials. SCINT 2015 - 13th International Conference on Inorganic Scintillators and Their Applications, Berkeley, USA Proc (2015), p.O14-1.
Schauer, P.; Lalinsky, O.; Lucenicova, Z.; Kucera, M.: Multicomponent garnet film scintillators for SEM electron detectors, doi: 10.1002/9783527808465.EMC2016.5236. EMC 2016 -The 16th European Microscopy Congress, Lyon, France, (Aug 2016), p.IM03-232. Práce, které uvádějí citaci:
Schauer, P; Lalinsky, O; Kucera, M; Lucenicova, Z; Hanus, M: Effect of Mg co-doping on cathodoluminescence properties of LuGAGG:Ce single crystalline garnet films. Opt. Mater. 72 (2017), p.359-366.
McDonald, KA; Schweitzer, GK: Synthesis of GAGG: Ce3+ powder for ceramics using mechanochemical and solution combustion methods. Journal of the American Ceramic Society 101 9 (2018), p.3837-3749.
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Citace, které neuvádějí přesný zdroj mých prací: . Práce, které uvádějí citaci:
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Walther, P; Ariano, BM; Kriz, S; Muller, M: High Resolution SEM Detection of Protein A Gold (15 nm) Marked Surface Antigens Using Backscattered Electrons. Beitr. Elektronenmikroskop. Direktabb. Oberfl. 16 (1983), p.539.
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Wood, CEC; Tabatabaei, SA; Mimomye, LV; Grober, LM: Reconstruction Controlled Dopant Incorporation and Coercion Effects in Molecular-Beam Epitaxial Germanium Grown on Gallium-Arsenide. J Appl Phys 76 4 (1994), p.2197-2201.
Takaoka, A; Hasegawa, T; Yoshida, K; Mori, H: Microscopic tomography with ultra-HVEM and applications. Ultramicroscopy 108 3 (2008), p.230-238.
Novak, L: Methods for quantification of detection channel for secondary electrons in scanning electron microscope. PhD Thesis, Masaryk University, Brno (2011).
Hawkes, PW: The tongue of the mind. Ultramicroscopy 116 (2012), p.138-156.
Hawkes, PW: Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement. in: Advances in Imaging and Electron Physics, Volume 190, Elsevier Inc., ISSN 1076-5670 (2015), p.143-175.
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